| 000 | 00640nam a2200241Ia 4500 | ||
|---|---|---|---|
| 008 | 141108s9999 xx 000 0 und d | ||
| 020 | _a0-471-49240-X | ||
| 041 | _aEnglish | ||
| 082 | _a621.38152 CHI | ||
| 100 | _aCHIIM | ||
| 111 | _aNO | ||
| 245 | _aSEMICONDUCTOR DEVICE AND FAILURE ANALYSIS : USING PHOTON EMISSION MICROSCOPY | ||
| 250 | _a1 | ||
| 260 |
_bJOHN WILEY AND SONS _c2000 |
||
| 300 |
_a269 _fPaper |
||
| 365 |
_b3700.00 _dRupees |
||
| 366 | _ePURCHASE | ||
| 541 |
_aSAK SANS BOOK _d08-08-2006 _cSupplier |
||
| 563 | _aHard Binding | ||
| 652 | _aSEMICONDUCTOR DEVICES | ||
| 852 | _aCENTRAL LIBRARY | ||
| 942 | _cBK | ||
| 999 |
_c16232 _d16232 |
||