SEMICONDUCTOR DEVICE AND FAILURE ANALYSIS : USING PHOTON EMISSION MICROSCOPY (Record no. 16232)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00640nam a2200241Ia 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 0-471-49240-X |
| 041 ## - LANGUAGE CODE | |
| Language code of text/sound track or separate title | English |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.38152 CHI |
| 100 ## - MAIN ENTRY--AUTHOR NAME | |
| Personal name | CHIIM |
| 111 ## - MAIN ENTRY--MEETING NAME | |
| Meeting name or jurisdiction name as entry element | NO |
| 245 ## - TITLE STATEMENT | |
| Title | SEMICONDUCTOR DEVICE AND FAILURE ANALYSIS : USING PHOTON EMISSION MICROSCOPY |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 1 |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Name of publisher | JOHN WILEY AND SONS |
| Year of publication | 2000 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | 269 |
| Type of unit | Paper |
| 365 ## - TRADE PRICE | |
| Price amount | 3700.00 |
| Unit of pricing | Rupees |
| 366 ## - TRADE AVAILABILITY INFORMATION | |
| Note | PURCHASE |
| 541 ## - IMMEDIATE SOURCE OF ACQUISITION NOTE | |
| Source of acquisition | SAK SANS BOOK |
| Date of acquisition | 08-08-2006 |
| Method of acquisition | Supplier |
| 652 ## - SUBJECT ADDED ENTRY--REVERSE GEOGRAPHIC (BK MP SE) [OBSOLETE] | |
| Geographic name of place element | SEMICONDUCTOR DEVICES |
| 852 ## - LOCATION/CALL NUMBER | |
| Location | CENTRAL LIBRARY |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Books |
| Home library | Current library | Date acquired | Cost, normal purchase price | Full call number | Accession Number | Invoice Number | Koha item type | Department |
|---|---|---|---|---|---|---|---|---|
| Central Library - SSNCE | Central Library - SSNCE | 08/11/2014 | 3700.00 | 621.38152 CHI | 24597 | 215 | Books | ECE |