| Item type | Current library | Call number | Status | Notes | Barcode | |
|---|---|---|---|---|---|---|
Books
|
Central Library - SSNCE | 621.395 WAN (Browse shelf(Opens below)) | Available | ECE | 26502 |
Total holds: 0
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| 621.395 VIN ANALOG AND MIXED MODE VLSI DESIGN | 621.395 VIN ANALOG AND MIXED MODE VLSI DESIGN | 621.395 VIN ANALOG AND MIXED MODE VLSI DESIGN | 621.395 WAN VLSI TEST PRINCIPLES AND ARCHITECTURES | 621.395 WAN SYSTEM ON CHIP TEXT ARCHITECTURES : NANOMETER DESIGN FOR TESTABILITY | 621.395 WAN VLSI TEST PRINCIPLES AND ARCHITECTURES : DESIGN FOR TESTABILITY | 621.395 WAN VLSI TEST PRINCIPLES AND ARCHITECTURES : DESIGN FOR TESTABILITY |
ALLIED 05-02-2007 Supplier
Hard Binding
Under Graduate
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