| Item type | Current library | Collection | Call number | Status | Notes | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|
Books
|
Central Library - SSNCE | 621.397 32 RAZ (Browse shelf(Opens below)) | Checked out | ECE | 03/08/2026 | 66338 | ||
Books
|
Central Library - SSNCE | Moved from SSNCE to SNUC | 621.397 32 RAZ (Browse shelf(Opens below)) | Available | Transferred books of SSNCE to SNUC | 66339 | ||
Books
|
Central Library - SSNCE | 621.397 32 RAZ (Browse shelf(Opens below)) | Available | ECE | 66340 |
Total holds: 0
Browsing Central Library - SSNCE shelves Close shelf browser (Hides shelf browser)
| 621.397 32 ASH SEMICONDUCTOR MEMORIES: TECHNOLOGY TESTING AND RELIABILITY | 621.397 32 ASH SEMICONDUCTOR MEMORIES: TECHNOLOGY TESTING AND RELIABILITY | 621.397 32 ASH SEMICONDUCTOR MEMORIES: TECHNOLOGY TESTING AND RELIABILITY | 621.397 32 RAZ DESIGN OF ANALOG CMOS INTEGRATED CIRCUITS | 621.397 32 RAZ DESIGN OF ANALOG CMOS INTEGRATED CIRCUITS | 621.397 32 RAZ DESIGN OF ANALOG CMOS INTEGRATED CIRCUITS | 621.39732 RAZ DESIGN OF ANALOG CMOS INTEGRATED CIRCUITS |
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