| Item type | Current library | Collection | Call number | Status | Notes | Barcode | |
|---|---|---|---|---|---|---|---|
Books
|
Central Library - SSNCE | Moved from SSNCE to SNUC | 621.397 32 ASH (Browse shelf(Opens below)) | Available | Transferred books of SSNCE to SNUC | 70464 | |
Books
|
Central Library - SSNCE | Moved from SSNCE to SNUC | 621.397 32 ASH (Browse shelf(Opens below)) | Available | Transferred books of SSNCE to SNUC | 70465 | |
Books
|
Central Library - SSNCE | 621.397 32 ASH (Browse shelf(Opens below)) | Available | ECE | 70466 | ||
Books
|
Central Library - SSNCE | Moved from SSNCE to SNUC | 621.397 32 ASH (Browse shelf(Opens below)) | Available | Transferred books of SSNCE to SNUC | 70467 | |
Books
|
Central Library - SSNCE | Moved from SSNCE to SNUC | 621.397 32 ASH (Browse shelf(Opens below)) | Available | Transferred books of SSNCE to SNUC | 70468 | |
Books
|
Central Library - SSNCE | Moved from SSNCE to SNUC | 621.397 32 ASH (Browse shelf(Opens below)) | Available | Transferred books of SSNCE to SNUC | 70469 | |
Books
|
Central Library - SSNCE | Moved from SSNCE to SNUC | 621.397 32 ASH (Browse shelf(Opens below)) | Available | Transferred books of SSNCE to SNUC | 70470 | |
Books
|
Central Library - SSNCE | Moved from SSNCE to SNUC | 621.397 32 ASH (Browse shelf(Opens below)) | Available | Transferred books of SSNCE to SNUC | 70471 | |
Books
|
Central Library - SSNCE | 621.397 32 ASH (Browse shelf(Opens below)) | Available | ECE | 70472 | ||
Books
|
Central Library - SSNCE | Moved from SSNCE to SNUC | 621.397 32 ASH (Browse shelf(Opens below)) | Available | Transferred books of SSNCE to SNUC | 70473 |
Total holds: 0
Browsing Central Library - SSNCE shelves Close shelf browser (Hides shelf browser)
| 621.397 32 ASH SEMICONDUCTOR MEMORIES: TECHNOLOGY TESTING AND RELIABILITY | 621.397 32 ASH SEMICONDUCTOR MEMORIES: TECHNOLOGY TESTING AND RELIABILITY | 621.397 32 ASH SEMICONDUCTOR MEMORIES: TECHNOLOGY TESTING AND RELIABILITY | 621.397 32 ASH SEMICONDUCTOR MEMORIES: TECHNOLOGY TESTING AND RELIABILITY | 621.397 32 ASH SEMICONDUCTOR MEMORIES: TECHNOLOGY TESTING AND RELIABILITY | 621.397 32 JAC THE MONTE CARLO METHOD FOR SEMICONDUCTOR DEVICE SIMULATION | 621.397 32 KUR MULTI VOLTAGE CMOS CIRCUIT DESIGN |
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Hard Binding
Under Graduate
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